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AFM SYSTEM

   In Nanotechnology Research Center Nanolab building, we have Veeco di CP-II multi mode AFM system with a 5um x 5um scanner stage and a   motorized z stage. CP-II has maximum application flexibility. Accurate measurements are performed with a closed-loop scan-linearization system. 20 bit   DACs are utilized for ultra low-noise piezo positioning control.

  APPLICATIONS:
  Materials Science
  Nanolitography
  Nanomanipulation 
  Polymer characterization
  Force-distance spectroscopy 

 
SPM Modes:
Contact AFM Mode (C-AFM)
Contact AFM Mode (C-AFM)
Lateral Force Microscopy (LFM)
Scanning Tunneling Microscopy (STM)
Magnetic Force Microscopy (MFM)
Nanolitography / Nanomanipulation

CONTROL SOFTWARE

 

 

 
MOCVD System    E-Beam Nanolithography     AFM System     Optical Measurements  Laboratory
Electrical Measurements Laboratory     Microwave Measurements Laboratory

 

  
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